Dr. Montserrat Ferrer is happy to answer your questions.
- 100 µm Minimum spot sizeCan even resolve fine structure details on circuit boards
- 2 nm-60 µm Thickness range for analysis of multiple multi-element-layersChallenging analysis of layer thickness and composition according to ASTM B568 and ISO 3497; including layers with repeating elements; programmable multipoint analysis
- 8 ppm Limits of detection for Cu, Zn in polymers or Pb in ZnRoHS screening, analysis of trace elements in solders, plastics, metal alloys; automatic correction on the material thickness, exact measurement spot positioning on PCB components
A compact Multi-purpose Benchtop micro-XRF Spectrometer
M1 MISTRAL is a compact benchtop energy dispersive micro-XRF analyzer for multi-purpose use. Easy to operate and designed for fast and cost-efficient operation in an industrial environment, M1 MISTRAL provides accurate information on the elemental composition and layer thickness of materials such as precious metal alloys as well as for multi-layer structures.
Bulk and coatings are analyzed according to ASTM standard B568 and to European norm ISO 3497. High accuracy can be achieved in the analysis of electroless deposited nickel phosphate (NiP) coatings with excitation through a Rh target.
The exact composition of all jewelry alloys, platinum group metals, or silver can be determined in a fraction of a minute. Results can be output either in weight-% or in carat.
The analysis can be performed standardless or standard-based to reach even higher levels of accuracy. A great variaty of calibrations is available for each application.
From positioning the sample to printing the results in a report – the full workflow is integrated in the software. At the same time full transperency is guaranteed with the open access to the raw data.
- Flexible instrument
- Easy to operate
- User-friendly touch screen interface
- Access to raw data