M1 Mistral
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Benefits
- 100 µm Minimum spot sizeCan even resolve fine structure details on circuit boards
- 2 nm-60 µm Thickness range for analysis of multiple multi-element-layersChallenging analysis of layer thickness and composition according to ASTM B568 and ISO 3497; including layers with repeating elements; programmable multipoint analysis
- 8 ppm Limits of detection for Cu, Zn in polymers or Pb in ZnRoHS screening, analysis of trace elements in solders, plastics, metal alloys; automatic correction on the material thickness, exact measurement spot positioning on PCB components
A compact Multi-purpose Benchtop micro-XRF Spectrometer
M1 MISTRAL is a compact benchtop energy dispersive micro-XRF analyzer for multi-purpose use. Easy to operate and designed for fast and cost-efficient operation in an industrial environment, M1 MISTRAL provides accurate information on the elemental composition and layer thickness of materials such as precious metal alloys as well as for multi-layer structures.
Bulk and coatings are analyzed according to ASTM standard B568 and to European norm ISO 3497. High accuracy can be achieved in the analysis of electroless deposited nickel phosphate (NiP) coatings with excitation through a Rh target.
The exact composition of all jewelry alloys, platinum group metals, or silver can be determined in a fraction of a minute. Results can be output either in weight-% or in carat.
The analysis can be performed standardless or standard-based to reach even higher levels of accuracy. A great variaty of calibrations is available for each application.
From positioning the sample to printing the results in a report – the full workflow is integrated in the software. At the same time full transperency is guaranteed with the open access to the raw data.
Key factors
- Flexible instrument
- Easy to operate
- User-friendly touch screen interface
- Access to raw data
M4 Tornado
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Benefits
- <20µm Spot sizeFocused X-ray beam with polycapillary lens
- 1 msMinimum dwell time per pixelMapping with stage speed up to 100 mm/s
- 12 Layers selectableMultilayer systems can be analyzed using the optional XMethod package
High performance micro-XRF with Market-Leading speed and flexibility
The M4 TORNADO is the tool of choice for sample characterization using small-spot micro X-ray fluorescence. Its measurements give information about composition and element distribution, even from below the surface. Bruker’s micro-XRF spectrometer is optimized for high-speed analyses of points, lines and 2D area scans (element mapping) of any kind of sample; be it organic, inorganic or liquid.
The primary X-ray excitation uses a polycapillary lens offering small spot sizes and high X-ray intensity. The M4 TORNADO is configurable with a variety of Bruker XFlash® silicon drift detectors (SDD), offering high throughput without compromising energy resolution.
One of the outstanding configuration options of the M4 TORNADO is the additional X-ray tube, which offers a different target material and a collimator changer for extended analytical capabilities.
M4 Tornado Plus
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Benefits
- CarbonLowest detectable elementAll elements starting from carbon can be measured
- >6 mm Depth of focus with AMSThe aperture management system (AMS) allows a sharp image on topographic samples
- 0.5-4.5 mmSelectable collimator sizesFour-position collimator changer on the additional tube
The revolutionary Super-Light Element micro-XRF Scanner
With the newest model of Bruker’s micro-XRF family, you can find out more about your sample than XRF ever showed you before.
With its super-light element detectors, the M4 TORNADO PLUS is the first micro-XRF scanner able to measure any element from carbon upwards. Additionally, the performance of all light elements is strongly increased.
On this instrument, Bruker introduced the patented aperture management system (AMS) that enhances the depth of focus of the polycapillary lens for sharper element mappings of uneven samples. The optional second X-ray source further extends the analytical capabilities with its four selectable spot sizes from 0.5 to 4.5 mm.
Lighter, Faster, Deeper.
The chamber of the M4 TORNADO family offers an option for He-flush. This increases the light-element performance while maintaining atmospheric pressure in the chamber. Light elements in biological or wet specimens can be analyzed without the need to freeze or dry the samples.
M4 Tornado Amics
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Benefits
- 16×19 cm Measurement areaPerfect for drill core or slabbed rocks – no polish or coating needed for analysis in the M4 TORNADOS’s large low-vacuum sample chamber
- >1340 Minerals in the databaseAMICS is pre-loaded with a user-expandable mineral database and uses whole spectrum matching of unknowns to this database
- <20 µm Spot sizeMap major, minor and trace elements and minerals at the resolution needed for most geologic problems
Automation of Micro-XRF Data Collection and Phase Identification
M4 TORNADO AMICS is an innovative new approach to automated mineralogy using X-ray excitation to collect energy spectra for mineral matching. This package matches the ultra-fast high resolution elemental distribution analysis of the M4 TORNADO and the automation and phase classification technology of the AMICS software.
- M4 TORNADO AMICS has a large sample chamber that operates at low atmospheric pressure requiring only a flat surface with no special coating or polishing. Perfect for slabbed core, hand sample slabs, and thin section billets, or even unpolished grain mounts.
- Quickly automate repeated measurements with a wide range of sample holders and customized measurement areas.
- Analyze entire samples to identify mineralogy or phases, characterize textures and associations, apply statistical calculations and report results as maps, charts, and graphs.
- The innovative Spectrum Tree empowers users to classify unknown phases including complex solid solutions, boundary and mixed phases.
M6 Jetstream
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Benefits
- 2×60 mm² SDD sizeDual silicon drift detector option for fastest acquisition
- 80×60 cm² Scannable surfaceMapping larger samples in one run
- 100-500 µmAdjustable spot sizeThe spot size can be adjusted in five steps to match the structure of the sample
State of the Art in Large Area micro-XRF
Micro-XRF on large samples (also called macro-XRF or MA-XRF) has become a decisive method for the analysis of paintings, geological samples, archeological artifacts and industrial components. The M6 JETSTREAM drives these analyses to the highest speed and accuracy. With its mobile wheelbase and adjustable frame, the M6 JETSTREAM can be used on-site instead of transporting the sample to the lab.
- Measurement of upright samples or horizontal surfaces
- Scannable area up to 800 x 600 mm²
- “On the fly” analysis for highest mapping speed
- Adjustable spot size to match the structure of the sample
- XFlash® SDD technology with up to 2 x 60 mm² detector area
- Optional aperture management system (AMS) to gain depth of focus on uneven surfaces
Crono
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Benefits
- 600×450 mm²Large area scanningCRONO can be programmed to scan a large area
- 42 mm/s Travel speedFast scanning of multiple elements simultaneously
- 0.5 mm Smallest collimator optionResolves fine structure details
Mobile Solution for Fast Element Mapping
The Bruker CRONO is easy to operate and reveals the crucial secrets of the object at which it is aimed. The optimal focus distance of 5 – 7 mm from the sample allows for non-contact measurement and is non-invasive and completely non-destructive. No sample preparation is required. Almost flat areas as large as 600 mm by 450 mm can be scanned.
The motorized frame can be setup with or without the support trolley in any orientation or easily be dismantled for transportation. The Bruker CRONO can be turned into a portable spot XRF spectrometer by installing the measurement head on a light tripod. Therefore the Bruker CRONO is ideal for on-site measurements.
High resolution optical images are recorded with an internal camera for each data point in addition to the XRF data. The Bruker CRONO can be equipped to with a He purging system to extend the range of detectable elements as far as Na (Z = 11) to U (Z = 92). The Bruker CRONO micro-XRF spectrometer is equipped with several X-ray filters to optimize the excitation conditions for specific applications.
A spectrum or a map can be recorded with the CRONO software. The automatic peak ID provides a quick visual indication of elements in a sample. The interface shows the spectrum and the element concentration while the acquisition is running. Data interpretation is easy with the overlay of the optical images and the XRF data.
The powerful data processing software ESPRIT Reveal offers many options for the offline analysis. No instrument connection is required for post-processing.
Key facts
- flexible, mobile system
- non-contact measurement
- non-invasive and non-destructive
- no sample preparation required
- easy measurement point monitoring
- detects a large range of elements: Na (Z = 11) to U (Z = 92)
- overlay of elemental distribution and optical images
Elio
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Benefits
- 2.1 kgTotal weight of the measurement headUltra-portable XRF scanner
- 1 mm Smallest collimator optionResolves fine structure details
- 100×100 mm² Mapping areaScans area for multiple elements simultaneously
Portable Micro-XRF Spectrometer with Mapping Option
The Bruker ELIO is easy to operate and reveals the crucial secrets of the object you aim at. High value objects are safe with the Bruker ELIO. The non-contact measurement is non-invasive and completely non-destructive. No sample preparation is required.
The light weight of the measurement head and the tripod make this system the only truly portable x-ray fluorescence (pXRF) spectrometer with mapping capabilities on the market and the perfect travel companion.
The alignment lasers identify the measurement point easily and ensure the correct and safe distance between sample and measurement head. High resolution optical images are recorded with an internal camera for each data point in addition to the XRF data.
The Bruker ELIO offers superior spectral quality with extremely low background which allows reliable qualitative trace element detection. The instrument can also be equipped with a He purging system to further extend the range of detectable elements as far as Na (Z = 11) to U (Z = 92). The Bruker ELIO micro-XRF spectrometer detects trace elements reliably thanks to the superior design of the electronics. The spectrometer can be equipped with several X-ray filters to optimize the excitation conditions for specific applications.
A spectrum or a map can be recorded with the ELIO software. The automatic peak ID provides a quick visual indication of elements in a sample. The interface shows the spectrum and the element concentration while the acquisition is running. Data interpretation is easy with the overlay of the optical images and the XRF data.
The powerful data processing software ESPRIT Reveal offers many options for the offline analysis.
Key facts
- truly portable and flexible
- non-contact measurement
- non-invasive and non-destructive
- no sample preparation required
- laser guidance and microscope camera for precise measurement position control
- overlay of elemental distribution and optical images
- reliable trace element detection