The Jeol “JMS-T200GC “AccuTOF GCx”is the 4th generation of the JEOL GC-High Resolution TOFMS to combine fast data acquisition speeds with high resolution/exact mass measurements and a high dynamic range for both qualitative and quantitative analysis.

With the AccuTOF GC, there is no tradeoff between speed and resolution. The AccuTOF GC combines high-speed acquisition with high-resolution -- plus it provides the highest linear dynamic range for analysis of both low and high concentrations.

• Always provides high resolution
• Easy exact mass measurements for determining elemental compositions
• Fast data accquisition – 50Hz (0.02sec/spectra)
• Wide dynamic range for GC/MS applications
• High sensitivity with full-range detection
• Optional CI Ion source
• Optional DEP/DIP probes
• Optional FD/FI Ion source

The AccuTOF™ GCx is designed for optimum throughput, operation, and uptime. An optional combination EI/FI/FD ion source eliminates the need for source exchange for these experiments. Gas chromatography/field ionization can also be used to characterize difficult samples.

Standard:

Electron Impact (EI)

Optional:

Chemical Ionization (CI)

Field Desorption (FD)

Field Ionization (FI)

Combination EI/FI/FD

Direct Probe (exposure and insertion)

Liquid Injection

Field Desorption Ionization (LIFDI)

• Mass accuracy of ≤ 1.5 mDa or 4 ppm (RMS)
• Mass resolution ≥ 10'000 (m/z 617)
• Signal-to-Noise ≥ 300 (1 pg OFN)
• Fast data recording speed with up to 0.02sec/spectra (50Hz)
• Mass range m/z from 4 to 6000
• Dynamic range: ≤ 4 order
• Ionization mode EI, optional CI, FD, FI, DEI (+/-), DCI (+/-)
• Sample inlets via GC, DEP, DIP, FD probe, LIFDI probe